Vertical Four-wave Dynamic Interferometer

The Vertical Four-wave Dynamic Interferometer LPI-100, capable of real-time dynamic measurements at a rate of up to 15 frames per second, accurately obtains the surface shape information of planar optical elements within a 100mm aperture through four-wave common path shearing technology and interference pattern demodulation. The interferometer is user-friendly, quick to deploy, reliable in operation, and highly precise in measurement. It provides dependable data support for optical processing companies, academic institutions, metrology departments, researchers in scientific organizations, and professionals writing scientific papers, making it an invaluable tool in their work.

Item Specification

Feature Of BOJIONG Vertical Four-wave Dynamic Interferometer

◆Up to 15 frames of real-time dynamic measurement

◆2nm RMS High phase resolution

◆Super high resolution of 262144 phase points

◆Based on the principle of common channel self-interference, the equipment does not need a reference mirror, and has a strong resistance Interference capability, in the ordinary factory environment can also achieve accurate detection of flat surface

◆Can realize real-time dynamic detection, can achieve 15 frames/second dynamic detection

◆With independent intellectual property rights, cost-effective, simple adjustment, compact structure

 Application Of BOJIONG Vertical Four-wave Dynamic Interferometer

This BOJIONG Vertical Four-wave Dynamic Interferometer equipped with FIS4 four-wave interferometric sensors, this device is capable of accurately detecting the shape of standard planar mirrors. The accompanying software processing system outputs the PV , RMS , and POWER values of the surface of the tested component.

BOJIONG Vertical Four-wave Dynamic Interferometer Details

BOJIONG Planar Four-wave Dynamic Interferometer overall layout diagram

The BOJIONG Vertical Four-wave Dynamic Interferometer is composed of several key functional modules, including an illumination light source module, a secondary beam expansion module, a carrier module, a spot focusing module for sample alignment, and an interferometric sensor module for detecting the surface shape of samples.

The system's light source module utilizes a helium-neon gas laser with a central wavelength of 632.8 nm, providing a precise and stable light source for the interferometer.

The secondary beam expansion module is designed to increase the beam diameter to 100 mm, ensuring compatibility with large-diameter optical components that require inspection.

The stage section serves as the platform for placing various planar optical components under test, such as flat crystals, single-throw wafers, window chips, and planar reflectors. The stage is equipped with X and Y axis handwheels for precise control of the sample's position, ensuring that the light spot emitted by the equipment fully covers the surface of the test sample. Additionally, two adjustment knobs are integrated into the stage to fine-tune the tilt of the sample, aligning the test plane perpendicular to the optical axis.

The imaging system features a dual-camera setup. One camera is an optical imaging camera that forms the spot focusing module, assisting in the alignment of the sample. By observing the real-time position of the sample's return spot, the sample can be adjusted to ensure the accuracy of the measurement. The other camera path is equipped with the FIS4 four-wave interferometric sensor, which constitutes the interferometric sensor module for detecting the surface shape of the sample. By capturing common-path interferometric fringes, it provides real-time, three-dimensional feedback on the surface topography of the test sample. The dual-camera system is capable of operating concurrently, enhancing the efficiency and accuracy of the measurement process.

Professional software module

◆The device is equipped with specialized software designed for the "Vertical Four-wave Dynamic Interferometer," which can display and output real-time 3D images of the measured optical element's surface, as well as provide PV, RMS, and POWER values for the measured surface.

◆Furthermore, the software has the capability to export raw measurement data, offering crucial quantitative analysis support for a variety of research endeavors, and enabling users to easily conduct subsequent data analysis and research work.