The High Resolution Wavefront Analyzer utilizes patented random coded four-wave diffraction technology, enabling the sensor to achieve self-interference in a single measured wavefront and to produce interference at the rear image plane position without the need for complex phase-shifting techniques. Due to its simple operation, ultra-high vibration resistance, and stability, BOJIONG's Analyzer provides an ideal wavefront sensing measurement solution, delivering nanometer-level precision measurements without the necessity for vibration isolation, significantly enhancing measurement efficiency and accuracy.
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Product name |
High Resolution Wavefront Analyzer |
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Wavelength range |
400nm~1100nm |
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Target size |
7.07mm×7.07mm |
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Spatial resolution |
23.6μm |
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Image pixel |
2048×2048 |
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Phase output resolution |
300×300（90000pixel） |
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Phase resolution |
＜2nmRMS |
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Absolute accuracy |
10nmRMS |
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Dynamic range |
110μm（150λ） |
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Sampling rate |
24fps |
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Real-time processing speed |
10Hz（At full resolution） |
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Interface type |
GIGE |
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Dimension |
56.5mm×43mm×41.5mm |
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Weight |
about 120g |
◆Broad spectrum 400nm~1100nm band
◆High resolution of 300×300 (90000) phase points
◆ultra-high vibration resistance, no need for optical vibration isolation
◆Single-channel light self-interference, no reference mirror required
◆2nm RMS high phase resolution
◆Achieve simple and fast interference light path construction
◆Supports collimated beams and large NA converged beams
This BOJIONG High Resolution Wavefront Analyzer used in laser beam wavefront detection, adaptive optics, surface shape measurement, optical system calibration, optical window detection, optical plane, spherical surface shape measurement, surface roughness detection
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laser beam wavefront detection |
Optical planar surface shape measurement |
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Optical spherical surface shape measurement |
Aberration measurement of optical systems |
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Optical window piece detection |
Measurement of lattice distribution inside the material |
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Adaptive optics - wavefront detection response in Zernike mode |
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BOJIONG High Resolution Wavefront Analyzer developed by a team of professors from Zhejiang University and Nanyang Technological University of Singapore, with domestic patented technology, it combines diffraction and interference to achieve a common four-wave transverse shear interference, with superior detection sensitivity and anti-vibration performance, and can realize real-time and high-speed dynamic interferometry without vibration isolation. The real-time measurement shows a frame rate of more than 10 frames. At the same time, the FIS4 sensor has an ultra-high phase resolution of 512×512 (260,000 phase points), the measurement band covers 200nm~15μm, the measurement sensitivity reaches 2nm, and the measurement repeatability is better than 1/1000λ (RMS). It can be used for laser beam quality analysis, plasma flow field detection, real-time measurement of high-speed flow field distribution, image quality evaluation of optical system, microscopic profile measurement and quantitative phase imaging of biological cells.
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FIS4 Technical parameters of each series of products |
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Product |
FIS4-UV |
FIS4-HR |
FIS4-UHR |
FIS4-HS |
FIS4-Cell |
FIS4-NIR |
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Wavelength range |
200~450nm |
400~1100nm |
400~1100nm |
400~1100nm |
400~1100nm |
900~1200nm |
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Target size mm² |
13.3×13.3 |
7.07×7.07 |
13.3×13.3 |
10.24×10.24 |
7.07×7.07 |
13.3×13.3 |
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Spatial resolution |
26μm |
23.6μm |
26μm |
24.4μm |
23.6μm |
26μm |
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Image pixel |
- |
2048×2048 |
- |
- |
2048×2048 |
- |
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Phase output resolution |
512×512 （262144pixel） |
300×300（90000pixel） |
512×512（262144pixel） |
420×420（176400pixel） |
300×300（90000pixel） |
512×512（262144pixel） |
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Phase resolution |
＜2nmRMS |
＜2nmRMS |
＜2nmRMS |
＜2nmRMS |
＜2nmRMS |
＜2nmRMS |
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Absolute accuracy |
10nmRMS |
10nmRMS |
15nmRMS |
10nmRMS |
10nmRMS |
15nmRMS |
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Dynamic range |
90μm （256λ） |
110μm （150λ） |
162μm （256λ） |
132μm （210λ） |
110μm （150λ） |
270μm （256λ） |
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Sampling rate |
32fps |
24fps |
45fps |
107fps |
24fps |
45fps |
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Real-time processing speed |
10Hz (Full resolution) |
10Hz (Full resolution) |
10Hz (Full resolution) |
10Hz (Full resolution)Supports delayed batch processing |
10Hz (Full resolution) |
10Hz (Full resolution) |
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Interface type |
USB3.0 |
GIGE |
USB3.0 |
GIGE |
GIGE |
USB3.0 |
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External interface |
- |
- |
- |
- |
C port |
- |
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Size mm² |
70x46.5x68.5 |
56.5x43x41.5 |
70x46.5x68.5 |
56.5x43x41.5 |
56.5x43x41.5 |
70x46.5x68.5 |
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weight |
about240g |
about120g |
about240g |
about120g |
about120g |
about240g |
Address
No. 578 Yingkou Road, Yangpu District, Shanghai, China
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