The high-resolution four-wave interferometric sensor is a highly efficient interferometric measurement tool specifically tailored for industrial applications, scientific research, and national defense sectors.
With its outstanding performance, this sensor offers a high resolution of 300×300 (90,000) phase points and a wide spectral response range of 400-1100nm, ensuring precision and reliability in various optical measurement scenarios.
Its unique technical features include the use of patented random coded four-wave diffraction technology, which allows the sensor to achieve self-interference in a single measured wavefront and to produce interference at the rear image plane position, without the need for complex phase-shifting techniques.
Moreover, BOJIONG's sensor is capable of displaying 3D results in full resolution at 10 frames per second in real-time, suitable for laser beam wavefront detection, adaptive optical systems, optical system calibration, optical window inspection, as well as measurements of optical plane and spherical shapes, including surface roughness and micro-profile detection.
With its easy operation, ultra-high vibration resistance, and stability, this sensor from BOJIONG provides an ideal wavefront sensing measurement solution, achieving nanometer-level precision measurements without the need for vibration isolation, significantly enhancing measurement efficiency and accuracy.
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Wavelength range |
400nm~1100nm |
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Target size |
7.07mm×7.07mm |
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Spatial resolution |
23.6μm |
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Image pixel |
2048×2048 |
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Phase output resolution |
300×300（90000pixel） |
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Phase resolution |
＜2nmRMS |
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Absolute accuracy |
10nmRMS |
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Dynamic range |
110μm（150λ） |
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Sampling rate |
24fps |
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Real-time processing speed |
10Hz（At full resolution） |
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Interface type |
GIGE |
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Dimension |
56.5mm×43mm×41.5mm |
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Weight |
about 120g |
◆Achieve simple and fast interference light path construction
◆Supports collimated beams and large NA converged beams
◆High resolution of 300×300 (90000) phase points
◆Single-channel light self-interference, no reference mirror required
◆Broad spectrum 400nm~1100nm band
◆2nm RMS high phase resolution
◆ultra-high vibration resistance, no need for optical vibration isolation
This BOJIONGHigh Resolution Four-wave Interferometric Sensor used in laser beam wavefront detection, adaptive optics, surface shape measurement, optical system calibration, optical window detection, optical plane, spherical surface shape measurement, surface roughness detection
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laser beam wavefront detection |
Optical planar surface shape measurement |
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Optical spherical surface shape measurement |
Aberration measurement of optical systems |
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Optical window piece detection |
Measurement of lattice distribution inside the material |
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Adaptive optics - wavefront detection response in Zernike mode |
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BOJIONG High Resolution Four-wave Interferometric Sensor developed by a team of professors from Zhejiang University and Nanyang Technological University of Singapore, with domestic patented technology, it combines diffraction and interference to achieve a common four-wave transverse shear interference, with superior detection sensitivity and anti-vibration performance, and can realize real-time and high-speed dynamic interferometry without vibration isolation. The real-time measurement shows a frame rate of more than 10 frames.
At the same time, the FIS4 sensor has an ultra-high phase resolution of 512×512 (260,000 phase points), the measurement band covers 200nm~15μm, the measurement sensitivity reaches 2nm, and the measurement repeatability is better than 1/1000λ (RMS). It can be used for laser beam quality analysis, plasma flow field detection, real-time measurement of high-speed flow field distribution, image quality evaluation of optical system, microscopic profile measurement and quantitative phase imaging of biological cells.
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FIS4 Technical parameters of each series of products |
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Product |
FIS4-UV |
FIS4-HR |
FIS4-UHR |
FIS4-HS |
FIS4-Cell |
FIS4-NIR |
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Wavelength range |
200~450nm |
400~1100nm |
400~1100nm |
400~1100nm |
400~1100nm |
900~1200nm |
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Target size mm² |
13.3×13.3 |
7.07×7.07 |
13.3×13.3 |
10.24×10.24 |
7.07×7.07 |
13.3×13.3 |
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Spatial resolution |
26μm |
23.6μm |
26μm |
24.4μm |
23.6μm |
26μm |
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Image pixel |
- |
2048×2048 |
- |
- |
2048×2048 |
- |
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Phase output resolution |
512×512 （262144pixel） |
300×300（90000pixel） |
512×512（262144pixel） |
420×420（176400pixel） |
300×300（90000pixel） |
512×512（262144pixel） |
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Phase resolution |
＜2nmRMS |
＜2nmRMS |
＜2nmRMS |
＜2nmRMS |
＜2nmRMS |
＜2nmRMS |
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Absolute accuracy |
10nmRMS |
10nmRMS |
15nmRMS |
10nmRMS |
10nmRMS |
15nmRMS |
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Dynamic range |
90μm （256λ） |
110μm （150λ） |
162μm （256λ） |
132μm （210λ） |
110μm （150λ） |
270μm （256λ） |
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Sampling rate |
32fps |
24fps |
45fps |
107fps |
24fps |
45fps |
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Real-time processing speed |
10Hz (Full resolution) |
10Hz (Full resolution) |
10Hz (Full resolution) |
10Hz (Full resolution)Supports delayed batch processing |
10Hz (Full resolution) |
10Hz (Full resolution) |
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Interface type |
USB3.0 |
GIGE |
USB3.0 |
GIGE |
GIGE |
USB3.0 |
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External interface |
- |
- |
- |
- |
C port |
- |
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Size mm² |
70x46.5x68.5 |
56.5x43x41.5 |
70x46.5x68.5 |
56.5x43x41.5 |
56.5x43x41.5 |
70x46.5x68.5 |
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weight |
about240g |
about120g |
about240g |
about120g |
about120g |
about240g |
Address
No. 578 Yingkou Road, Yangpu District, Shanghai, China
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