FIS4 four-wave interferometer sensor is developed by a team of professors from Zhejiang University and Nanyang Technological University, Singapore. It has domestic patent technology, combines diffraction and interference, realizes common-path four-wave lateral shear interference, has super detection sensitivity and vibration resistance, and can achieve real-time, high-speed dynamic interferometer measurement without vibration isolation; the real-time measurement display frame rate reaches more than 10 frames. At the same time, the FIS4 sensor has an ultra-high phase resolution of 512×512 (260,000 phase points), the measurement band covers 200nm~15μm, the measurement sensitivity reaches 2nm, and the measurement repeatability is better than 1/1000λ (RMS). It can be used for laser beam quality analysis, plasma flow field detection, high-speed flow field distribution real-time measurement, optical system image quality evaluation, microscopic contour measurement and biological cell quantitative phase imaging, etc.
FIS4 interference sensor single beam interference optical path
The working principle of the four-wave interference sensor is that the wavefront to be detected is diffracted by a random coded hybrid grating, and four diffracted lights are generated in two orthogonal directions. These four diffracted lights interfere on the imaging surface, and four wavefront lateral shear interference fringes can be obtained.
Advantages of the four-wave interference sensor: single optical path interference has super strong vibration resistance, no reference light is required, simple layout, no special interference device is required, quick and easy adjustment, real-time imaging is possible, no phase shift process is required, and it is particularly suitable for high-precision detection in factory environments.
