Designed to assist scientific research and high-precision industrial scenarios, higher resolution can provide more detailed information in wavefront detection, ultra-high resolution of 512×512 (262144) phase points, 400-1100nm wide spectrum response, 10 frames of full-resolution real-time 3D result display, providing ideal wavefront sensing measurement tools for laser beam wavefront detection, adaptive optics, plane surface measurement, optical system calibration, optical window detection, optical spherical surface measurement, surface roughness detection, surface micro-contour, etc.
FIS4-UHR ultra-high resolution four-wave interferometer sensor uses patented random coded four-wave diffraction technology to achieve single-channel wavefront self-interference, and interference occurs at the rear image plane position. It has low requirements on the coherence of the light source and does not require phase shifting. Ordinary imaging systems can achieve interference measurement. It has ultra-high vibration resistance and ultra-high stability, and can achieve nm-level precision measurement without vibration isolation. Compared with the microlens array Hartmann sensor, it has more phase points, wider adaptive band range, larger dynamic range and lower price.
Main features
◆ Ultra-high resolution of 512×512 (262144) phase points
◆ Single-path light self-interference, no reference light required
◆ Wide spectrum 400nm~1100nm band
◆ 2nm RMS high phase resolution
◆ Extremely strong vibration resistance, no need for optical vibration isolation
◆ Simple and fast optical path construction like imaging
◆ Support collimated beam, large NA converging beam
Product application
Laser beam wavefront detection, adaptive optics, plane surface measurement, optical system calibration, optical window detection, optical plane, spherical surface measurement, surface roughness detection.
